Charge-Separated Spectra Of Suprathermal Highly Charged Bismuth Ions In A Dual Laser-Produced Plasma Soft X-Ray Source

We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer. The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for the development of debris mitigation schemes in a soft x-ray microscope.