Origin of Mechanical and Dielectric Losses from Two-Level Systems in Amorphous SiliconM. Molina-Ruiz,Y. J. Rosen,H. C. Jacks,M. R. Abernathy,T. H. Metcalf,X. Liu,J. L. DuBois,F. HellmanPhysical Review Materials(2021)引用 15|浏览39AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要