Holographic Reconstruction of the Interlayer Distance of Bilayer Two-Dimensional Crystal Samples from Their Convergent Beam Electron Diffraction Patterns.
Ultramicroscopy（2020）
关键词
Graphene,Twisted bilayer graphene,Multilayer graphene,van der Waals structures,Interlayer distance,Transmission electron microscopy,TEM,Convergent beam electron diffraction,CBED
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要