Detection of charge around a nanoparticle in a nanocomposite using electrostatic force microscopy

IEEE Transactions on Dielectrics and Electrical Insulation(2020)

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摘要
In this work, electrostatic force microscopy (EFM) is used to investigate the interface around a nanoparticle in terms of its properties viz. electric charge density and dielectric constant. Nanodielectrics composed of barium titanate (BaTiO3) nanoparticles embedded in epoxy matrix are used for the study. Phase shift images obtained from EFM experiments indicate the region occupied by an embedded ...
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关键词
Force,Surface topography,Computational modeling,Electrostatics,Dielectric constant,Microscopy,Surface morphology
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