Analysis of D 0 ! K KX
semanticscholar(2007)
摘要
Using data taken with the CLEO II detector, we have studied the decays (0:074 0:010 0:015)% where the rst errors are statistical and the second errors are the estimate of our systematic uncertainty. We also present a new upper limit B(D 0 ! K 0 S K 0 S 0) < 0:059% at the 90% conndence level and the rst measurement of B(D 0 ! K + K ? 0) = (0:14 0:04)%.
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