Novel DFTs for Circuit Initialization to Reduce Functional Fmax Test Time
semanticscholar(2013)
摘要
Using functional test for Fmax analysis is still an effective method used in practice in spite of the fact that the test cost associated with functional Fmax test remains to be a major problem. In this paper, we develop novel design-for-testability (DFT) structures to considerably reduce the cost of initializing the circuit during functional test.
更多查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要