Simulation-based optimization of nano-XCT scans for high-resolution applications

In this work a simulation-based approach is used to optimize a certain h igh-resolution inspection task of an AlSiCu material system. The actual scans that are also used for the verification of the sim ulation results are performed on a new lab-based nanofocus X-ray computed tomography (nano-XCT) system that is equipped with two different detector systems . Depending on the material system and the measurement task, the user has to choose between th ese two detector types. In order to simplify user operation and optimize scan quality, numerical simulations with the tool SimCT are perfor med to find suitable scanning parameters and strategies without relying on long and time-consumin g scanning series. Theoretical limits on resolution and contrastto-noise ratio are compared with experimental results.