nmat1889 Fink Review.indd

S. D. HART2*, K. KURIKI1*, N. ORF2, O. SHAPIRA3, F. SORIN2, B. TEMELKURAN1* AND Y. FINK1,2† 1Research Laboratory of Electronics, 2Department of Materials Science and Engineering, 3Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA; 4Department of Physics, Bilkent University, Ankara 06800, Turkey *Present addresses: 3M Display and Graphics Film Laboratory, 3M Center, Building 0236-02-A-06, St Paul, Minnesota 55144, USA (G. B.); 3M Optical Systems Division, 3M Center, Building 235-1E-54, St Paul, Minnesota 55144, USA (S. D. H.); GE-Plastics, Global Marketing, Global Application Technology, 2-2 Kinugaoka, Moka, Tochigi 321-4392, Japan (K. K.); OmniGuide, One Kendall Square Building 100, 3rd Floor, Cambridge, Massachusetts 02139, USA (B. T.) †e-mail: yoel@mit.edu