Counterfeit IC Detection : Test Method Selection Considering Test Time , Cost , and Tier Level Risks

The counterfeiting of electronic components has become a major concern to the global electronic supply chain. To address this increasing threat, a specialized service of testing, detection, and avoidance of counterfeit parts has been created. However, because of the excessive test time and cost, and their difficulty of implementation, it is absolutely necessary to find an optimum set of tests that gives the maximum test confidence. In this paper, we develop a new metric called counterfeit defect coverage (CDC) that represents the level of confidence in detecting a counterfeit component after performing a set of tests. We formulate an optimization problem to identify an optimum set of test methods needed to maximize CDC while considering constraints on test time, cost, and application risks. We will present the assessment of a set of recommended test methods using CDC metric and the data collected by G-19A Test Laboratory Standards Development Committee.