PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community
2020 IEEE European Test Symposium (ETS)(2020)
摘要
Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF “secure” specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.
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关键词
Physically Unclonable Functions (PUF),Standardization,Enrollment,Challenge/Response Pair Database Management,On Line Test
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