No Trouble Found (NTF) Customer Return Analysis

Thong Tran, Sudheer Reddy Gundala, Komal Soni, Aaron Baker, Adam Fogle,Sandhya Chandrashekhar

2020 IEEE International Reliability Physics Symposium (IRPS)(2020)

引用 3|浏览2
暂无评分
摘要
This paper analyzes NTF customer returns using production test data to verify if they can be screened. A total of 70 NTF customer returned units from multiple lots spanning three different product families across different customer applications and market segments were examined using three statistical methods - Principal Component Analysis (PCA), Mahalanobis Distance, and binary Support Vector Machine (SVM) in search of potential outliers. The data shows the NTF customer returns are not marginal units and cannot be screened without significant yield penalty.
更多
查看译文
关键词
Field returns,No trouble found,Product reliability,Semiconductor device testing,Statistical analysis
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要