Innovative Test Practices in Asia

Takeshi Iwasaki,Masao Aso,Haruji Futami,Satoshi Matsunaga,Yousuke Miyake,Takaaki Kato,Seiji Kajihara,Yukiya Miura,Smith Lai, Gavin Hung,Harry H. Chen,Haruo Kobayashi,Kazumi Hatayama

2020 IEEE 38th VLSI Test Symposium (VTS)（2020）

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摘要

The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control method of at-speed scan test for IR violation reduction. These would be useful for automotive and IoT application device testing.

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关键词

in-field test,power control method,at-speed scan test,automotive IoT application device testing,innovative test practices,Asia,IP session,testing solution,on-chip delay measurement method,IR violation reduction

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