Investigation of Potential-Induced Degradation in Bifacial n-PERL Modules

A potential-induced degradation (PID) test method for bifacial double-glass silicon modules is first recommended for studying PID effects at the particular side of interest (the front or rear). This could be achieved by maintaining the same electric potential between solar cells and the untargeted module surface. Using the recommended test method, PID effects on the rear of n-type bifacial passiva...