A Test Architecture and VIE to Characterize Dielectric Absorption in Small Capacitors

Carlos Bernal,Manuel Jimenez, Chris Aquino, Raul Cedres

2020 IEEE Latin-American Test Symposium (LATS)（2020）

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摘要

This paper presents an automated procedure to characterize dielectric absorption (DA) in small discrete and integrated capacitors. A circuit setup with integrating, active filtering, and amplifying stages was developed along with a Lab VIEW™ virtual instrument environment (VIE) to perform completely automated DA tests. The setup's precision and accuracy were validated by statistical means. Evaluations of the proposed setup over a wide range of test conditions, capacitance values, and capacitor technologies were performed.

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关键词

test conditions,capacitor technologies,test architecture,VIE,dielectric absorption,small capacitors,automated procedure,discrete capacitors,integrated capacitors,circuit setup,active filtering,amplifying stages,virtual instrument environment,DA tests

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