Evaluation of deep interface states for SiC-MOS capacitor by photo-assisted CV methodHideaki Matsuyama,Yutaka Terao,Katsunori Ueno,Shinya TakashimaThe Japan Society of Applied Physics(2020)引用 23|浏览1暂无评分关键词High-k DielectricsAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要