S3DET: Detecting System Symmetry Constraints for Analog Circuits with Graph Similarity

2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)(2020)

引用 24|浏览90
暂无评分
摘要
Symmetry and matching between critical building blocks have a significant impact on analog system performance. However, there is limited research on generating system level symmetry constraints. In this paper, we propose a novel method of detecting system symmetry constraints for analog circuits with graph similarity. Leveraging spectral graph analysis and graph centrality, the proposed algorithm can be applied to circuits and systems of large scale and different architectures. To the best of our knowledge, this is the first work in detecting system level symmetry constraints for analog and mixed-signal (AMS) circuits. Experimental results show that the proposed method can achieve high accuracy of 88.3% with low false alarm rate of less than 1.1% in largescale AMS designs.
更多
查看译文
关键词
analog circuits,graph similarity,analog system performance,system level symmetry constraints,system symmetry constraints,spectral graph analysis,graph centrality,analog and mixed-signal circuits
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要