A Directed Test Generator for Shared-Memory Verification of Multicore Chip Designs

The functional verification of multicore chips requires the generation of parallel test programs able to expose design errors and ensure high coverage in less time. Albeit the coherence hardware can scale gracefully as the number of cores grows, the state space of the coherence protocol increases exponentially. That is why this article describes a directed test generation approach that exploits random test generation (RTG) for avoiding explicit enumeration of the coherence state space while memory consistency is verified. The novel approach was designed for synergy between a data-driven engine that explores neighborhoods toward higher coverage and a model-based engine that exploits constraints while driving RTG toward faster coverage evolution. As compared to a state-of-the-art data-driven generator and to a model-based generator, the proposed approach led to superior coverage evolution with time, when targeting 32-core designs relying on different protocols. For MOESI 2-level, the novel approach was from 4.8 to 18.7 faster to reach the data-driven generator's maximal coverage, and it was up to 2.7 faster to reach the model-driven generator's. For MESI 3-level, it found, in 10 to 15 min, a few errors whose detection required the data-driven generator 45 min to 7 h.