Ohmic contacts study of P+N diodes on (111) and (100) diamond
2019 IEEE 13th International Conference on Power Electronics and Drive Systems (PEDS)(2019)
摘要
Pseudo-vertical P
+
N diamond diodes are fabricated. We focused on the determination of specific contact resistance of Ti-based contacts for (111) and (100) p-type diamond layers doped around 10
19
at/cm
3
using circular Transfer Length Method (cTLM). Ohmic behavior is obtained and the variation of the specific contact resistance is discussed.
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关键词
specific contact resistance,Ti-based contacts,Ohmic contacts,(100) diamond,(111) diamond,pseudo-vertical P+N diamond diodes,doping,circular transfer length method,epitaxial growth,Ti-Pt-Au-C,C
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