Challenges in Radio Frequency and Mixed-Signal Circuit Reliability

V. Reddy, S. Martin, K. Benaissa, C. Chancellor, K. Bhatia,V. Srinivasan,V. Rentala,S. Krishnan, J. Ondrusek

2019 IEEE International Electron Devices Meeting (IEDM)（2019）

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摘要

The reliability challenges encountered during the design of radio frequency (RF) and mixed-signal circuits are discussed. RF circuits can operate at voltages greater than twice the nominal supply voltage and thus hot-carrier and off-state aging are key considerations. Mixed-signal circuits also present a reliability challenge due to their stringent matching and offset requirements.

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关键词

RF circuits,nominal supply voltage,mixed-signal circuit design,radio frequency,mixed-signal circuit reliability,radio frequency circuit design,hot-carrier,off-state aging

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