An improved steady-state method for measuring the thermal contact resistance and bulk thermal conductivity of thin-walled materials having a sub-millimeter thickness

•The thermal contact resistance of sub-mm thick thin-walled materials was measured.•An improved method was proposed by in situ measurement on the sample thickness.•The bulk thermal conductivity of the thin-walled materials was able to be obtained.•The tiny thickness change was measured using a precise laser displacement sensor.•The method was verified using bulk samples having a known thermal conductivity.