Entire Domain Basis Function Expansion of the Differential Surface Admittance for Efficient Broadband Characterization of Lossy Interconnects

This article presents a full-wave method to characterize lossy conductors in an interconnect setting. To this end, a novel and accurate differential surface admittance operator for cuboids based on entire domain basis functions is formulated. By combining this new operator with the augmented electric field integral equation, a comprehensive broadband characterization is obtained. Compared with the state of the art in differential surface admittance operator modeling, we prove the accuracy and improved speed of the novel formulation. Additional examples support these conclusions by comparing the results with commerical software tools and with measurements.