IEEE European Test Symposium (ETS)

Stephan Eggersglüß,Said Hamdioui,Artur Jutman,Maria K. Michael,Jaan Raik,Matteo Sonza Reorda,Mehdi Baradaran Tahoori,Elena Ioana Vatajelu

2019 IEEE International Test Conference (ITC)（2019）

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摘要

This paper is dedicated to the IEEE European Test Symposium (ETS). It offers an overview of all the European Test Workshop and Symposium events, from its first edition in 1996 to the next edition in 2020.

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