On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits

2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS)(2019)

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摘要
This paper proposes a novel strategy to detect aging in high frequency integrated circuits based on on-line temperature monitoring using built-in differential temperature sensors. To theoretically prove the feasibility of the technique, the paper describes the electro-thermal methodology followed to assert the sensitivity of the temperature sensor's output voltage to track the aging of a 2.4 GHz class A power amplifier.
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关键词
built-in temperature sensors,CMOS high frequency analog circuits,aging monitoring,electro-thermal analysis
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