AlGaN/GaN HEMT channel temperature determination utilizing external heater
SEMICONDUCTOR SCIENCE AND TECHNOLOGY(2020)
摘要
An improved method of average channel temperature and channel temperature profile determination is introduced in this paper applied to AlGaN/GaN HEMT using quasi-static I-V characterization and external heater. Particular HEMT resistances and threshold voltage were experimentally determined at different ambient temperatures from TLM measurements, HEMT output and transfer I-V characteristics. Negligible pinch-off area and leakage current dependence on drain voltage allows to obtain average temperature similar to 77 degrees C for dissipated power 1.5W using simple recurrent differential calculations. The HEMT channel temperature profile exhibiting maximum peripheral temperature similar to 130 degrees C for dissipated power 1.5W was simulated and verified utilizing the device electrical parameters variation.
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关键词
AlGaN,GaN,FET,HEMT,temperature profile,dissipated power
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