Thermoreflectance-Based Measurement of Facet Optical Absorption in High Power Diode Lasers

IEEE Photonics Technology Letters(2019)

引用 7|浏览38
暂无评分
摘要
Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, the absorption properties of facet coatings and passivation layers, and the age of the device. The ability to quantify facet absorption is an essential step toward improving the reliability and maximum output power of diode laser systems. In this work, we have developed a technique to measure facet absorption in diode lasers using a combination of facet thermoreflectance imaging and a heat transport model. The approach can be used for a wide range of both coated and uncoated diode lasers.
更多
查看译文
关键词
Temperature measurement,Diode lasers,Absorption,Optical variables measurement,Heating systems,Optical imaging,Surface emitting lasers
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要