Correlations between structural changes and dielectric behavior of thermally aged XLPE

This study aims at elucidating the correlations between structural changes and the variation of dielectric properties of cross-linked polyethylene (XLPE) during thermal aging. For this purpose, thermal aging experiments were carried out on XLPE samples at 80, 100, 120 and 140 °C for different aging times for a maximum total duration of 5040 hours. Chemical changes were assessed by Fourier transform infrared spectrum (FTIR). Besides, the crystallinity ratio and the melting temperature were evaluated using differential scanning calorimetry (DSC). Frequency domain dielectric spectroscopy was used to investigate the evolution of the dielectric constant and losses of XLPE during aging. The results show that aging at 80 and 100 °C could help to improve the crystalline state of XLPE which leads to the decrease of the dielectric constant. However, for higher thermal stress, the main aging mechanism of XLPE is thermal oxidation which leads to deteriorate the morphology and increase both the polarization and losses, mainly at low frequencies. It has been found also that in some cases, the non-homogeneity of the color of XLPE seems to indicate the increase of interfaces in the material which could lead to increase the dielectric losses due to the interfacial polarization.