Application of Stochastic FDTD to thin-wire analysis

This paper presents an extension of the stochastic FDTD method to predict the variance of currents and voltages in the Holland thin-wire formulation. A discussion is made on the effect of cross-correlation between the variables affected by incertitude, and the variability of the observed quantities. For this, a simple dipole antenna loaded with a Wu-King profile is analyzed, the obtained results are validated with comparisons using Monte Carlo methods.