First measurement of S/XB values of Re I visible emission lines

A spectroscopic parameter, so called S/XB (the number of ionization events per photon or inverse photon efficiency), is experimentally determined for Re I visible emission lines (488.9, 527.1, and 527.6 nm) at an electron temperature range of similar to 2-8 eV in the PISCES-B linear plasma device. Our standard mass loss method was applied, where a pure Re sample was sputtered by Ar plasma. In addition, a new alloy method was developed, where a W-3.3 at% Re alloy sample was used. In the new method, the sputtered flux ratio of Re and W atoms is assumed to be the same as the elemental composition because of the very similar sputtering yields. Good agreement in measured Re I S/XB values is obtained between the standard mass loss and new alloy methods.