Label Free Ultra-Sensitive Imaging with Sub-Diffraction Spatial Resolution
ICTON(2019)
摘要
In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.
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关键词
optical microscopy,label free imaging,nano-sensitivity,super-resolution,spatial frequency
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