Oxygen Content and Bias Influence on Amorphous InGaZnO TFT-Based Temperature Sensor Performance

IEEE Electron Device Letters(2019)

引用 6|浏览25
暂无评分
摘要
A temperature (T) sensor based on an amorphous InGaZnO (a-IGZO) thin-film transistor (TFT) is demonstrated and its performance is analyzed quantitatively. The performance analysis includes the influences of the gateto-source bias (VGS) and oxygen content in IGZO on the mobility (μ), threshold voltage (VT), and drain-to-source current (IDS) of TFTs. The linearity and sensitivity of the sensor are f...
更多
查看译文
关键词
Thin film transistors,Iron,Temperature sensors,Performance evaluation,Logic gates,Sensitivity,Object recognition
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要