Methods for RFSOI Damascene Tungsten Contact Etching

Daisy Vaughn, Felix Anderson, Ron Meunier, Thai Doan,Anthony Stamper

2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)(2019)

引用 0|浏览0
暂无评分
摘要
GLOBALFOUNDRIES has ramped its 180nm generation RFSOI foundry technology into high volume production at multiple 200mm and 300mm fabricators. This RFSOI technology was optimized primarily for sub-6GHz RF switches, tuners, and low noise amplifiers used in cell phone front-end-modules. The thin SOI wafer top silicon layer presents challenges in contact etching and this paper summarizes the optimization of contact etching to significantly reduce the final contact dielectric thickness consumption and improve copper M1 wire to FET gate polysilicon (M1-Poly) shorting yield.
更多
查看译文
关键词
RFSOI damascene tungsten contact,GLOBALFOUNDRIES,high volume production,low noise amplifiers,cell phone front-end-modules,SOI wafer top silicon layer,final contact dielectric thickness consumption,multiple fabricators,RFSOI foundry technology,RF switches,tuners,contact etching optimization,contact dielectric thickness consumption,copper M1 wire,FET gate polysilicon shorting yield,size 300.0 mm,size 180.0 nm,size 200.0 mm,W,Si
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要