Optical Beam Induced Current and Time Resolved Electro-Luminescence in Vertical Cavity Surface Emitting Lasers During Accelerated Aging

IEEE Photonics Journal(2019)

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摘要
Vertical Cavity Surface Emitting Lasers are characterized under a high magnification optical microscope for reliability during accelerated aging using Optical Beam Induced Current and Electroluminescence imaging and spectroscopy, and also with electrical IV characterization. EL image data is captured with time resolution during device failure, and compared to the OBIC images, yielding insight into...
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关键词
Vertical cavity surface emitting lasers,Apertures,Stress,Measurement by laser beam,Microscopy,Optical filters
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