Probing Material Morphology and Deformation as a Response to in situ Loading using X-ray TomographyBrian M. Patterson,Lindsey Kuettner,Nikolaus Cordes,Kevin Henderson,Matthew Herman, Cindy Welch,John Carpenter,Colt Montgomery,Tao Sun,Kamel Fezzaa,Xianghui Xiao,Jason Williams,Nikhilesh ChawlaMicroscopy and Microanalysis(2019)引用 1|浏览39暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要