Optimal Design of Passive Devices for Verifying On-wafer Noise Parameter Measurement Systems

We propose the optimal design of passive devices that can be used to verify on-wafer noise parameter measurement systems. The design principles result from obtaining the minimum relative uncertainties of four noise parameters: Fmin, Rn, |Γopt|, and <; Γopt for a wide range of S-parameters of a passive two-port network. A Monte Carlo method has been used for the investigation, and simulation result...