Total internal reflection fluorescence pattern-illuminated Fourier ptychographic microscopy

Optics and Lasers in Engineering(2019)

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摘要
•Total internal reflection fluorescence pattern-illuminated Fourier ptychographic microscopy is more robust to noise and system aberration than total internal reflection fluorescence structured illumination micrscopy.•Total internal reflection fluorescence pattern-illuminated Fourier ptychographic microscopy can digitally correct the aberration in an iterative manner.•More recorded low-resolution images facilitate the convergence of pattern-illuminated Fourier ptychographic algorithm.
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