Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks

IEEE Journal of Photovoltaics, pp. 1064-1072, 2019.

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Photovoltaic cellsTrainingSemiconductor device modelingData visualizationSiliconMore(2+)

Abstract:

This paper investigates deep convolutional neural networks (CNNs) for the assessment of defects in multicrystalline silicon (mc-Si) and high-performance mc-Si wafers for solar cell production based on photoluminescence (PL) images. We identify and train a CNN regression model to forecast the I-V parameters of passivated emitter and rear c...More

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