Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks

IEEE Journal of Photovoltaics, pp. 1073-1080, 2019.

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Keywords:
Data visualizationFeature extractionSemiconductor device modelingPhotovoltaic cellsTrainingMore(2+)

Abstract:

Convolutional neural networks can be trained to assess the material quality of multicrystalline silicon wafers. A successful rating model has been presented in a related work, which directly evaluates the photoluminescence (PL) image of the wafer to predict the current-voltage parameters after solar cell production. This paper presents th...More

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