Application of Stochastic FDTD to Holland's Thin-Wire Method

This letter presents an extension of the stochastic finite-difference time-domain (FDTD) method to predict the standard deviation of currents and charges in the Holland FDTD subcell method for thin wires. A discussion is presented on the effect of cross correlation between the variables affected by uncertainty and the variability of the observed quantities. For this, a simple dipole antenna loaded with a Wu–King profile is analyzed, and the results are validated with the Monte Carlo method.