Demonstration of a robust insertion loss measuring approach for low-loss silicon photonic devices.
OPTICS EXPRESS(2019)
摘要
A robust optical insertion loss measuring approach based on a symmetrically coupled add-drop microring resonator is demonstrated on silicon-on-insulator platform. Utilizing resonant wavelengths and relative values of measured optical power, this approach frees the insertion loss measurement from the uncertainties caused by experimental set-up, including system alignment and wavelength dependence of the couplers. Strip-slot mode converters were fabricated and measured to present the exemplary insertion loss measurement process. A series of experimental results confirm that the insertion loss of the low-loss silicon photonic devices can be accurately and reliably obtained even the adopted couplers are wavelength-dependent, and the fibers are deviated 15 mu m from the horizontal direction and 110 mu m from the vertical direction, exhibiting excellent robustness to the experimental set-up. (c) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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