Photoemission spectroscopy study of structural defects in molybdenum disulfide (MoS 2 ) grown by chemical vapor deposition (CVD).

The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the photoluminescence spectra.