A Generated 7GS/s 8b Time-Interleaved SAR ADC with 38.2dB SNDR at Nyquist in 16nm CMOS FinFET

2019 IEEE Custom Integrated Circuits Conference (CICC)(2019)

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摘要
This paper presents a 7GS/s 8-bit time-interleaved SAR ADC instance produced from a generator-based design flow in a 16nm CMOS FinFET technology. Design techniques such as cross-coupled routing and clock delay modulation are utilized for compatibility with a FinFET process. The time-interleaved SAR ADC layout is automatically generated by placing templates and wires on a grid to abstract design rules. The generated ADC instance with digital calibration achieves 38.2dB SNDR, 97.2fJ/conv-step Walden Figure-of-Merit (FoMW), and 150.6dB Schreier Figure-of-Merit (FoMS), consuming 45.2mW from a 0.95V analog supply and a 0.72V digital supply, and occupying 0.157mm 2 .
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关键词
time-interleaved SAR ADC layout,abstract design rules,generator-based design flow,cross-coupled routing,clock delay modulation,FinFET process,CMOS FinFET technology,time-interleaved SAR ADC instance,digital calibration,voltage 0.72 V,size 16.0 nm,power 45.2 mW,voltage 0.95 V,word length 8 bit
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