Barrier Inhomogeneity of Schottky Diode on Nonpolar AlN Grown by Physical Vapor Transport

IEEE Journal of the Electron Devices Society(2019)

引用 18|浏览0
暂无评分
摘要
An aluminum nitride (AlN) Schottky barrier diode (SBD) was fabricated on a nonpolar AlN crystal grown on tungsten substrate by physical vapor transport. The Ni/Au-AlN SBD features a low ideality factor n of 3.3 and an effective Schottky barrier height (SBH) of 1.05 eV at room temperature. The ideality factor n decreases and the effective SBH increases at high temperatures. The temperature dependen...
更多
查看译文
关键词
Aluminum nitride,III-V semiconductor materials,Crystals,Nonhomogeneous media,Schottky barriers,Temperature,Substrates
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要