Full-Wafer Strain and Relaxation Mapping of Hg1−xCdxTe Multilayer Structures Grown on Cd1−yZnyTe Substrates
Journal of Electronic Materials(2019)
关键词
HgCdTe,molecular beam epitaxy,strain,dislocations,fully depleted infrared detectors
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要