Third-Phase Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT ProcessHiroto Kobayashi,Ryo Yokogawa, Kosuke Kinoshita,Yohichiroh Numasawa,Atsushi Ogura,Shin-ichi Nishizawa,Takuya Saraya,Kazuo Ito,Toshihiko Takakura,Shin-ichi Suzuki,Munetoshi Fukui,Kiyoshi Takeuchi,Toshiro HiramotoThe Japan Society of Applied Physics(2019)引用 23|浏览7暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要