Practical Fault Localization with Combinatorial Test Design

    Andrew Hicks
    Andrew Hicks
    Ryan Rawlins
    Ryan Rawlins

    2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 268-271, 2019.

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    Abstract:

    Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based...More

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