Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP

2019 IEEE International Reliability Physics Symposium (IRPS)(2019)

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摘要
A concise 1-D analytical expression is derived for temperature evolution during pulsed heating. A decreasing exponential temperature profile is shown to be a good approximation for such a profile. It is used to estimate of the failure temperature T rail in two amorphous Indium-Gallium-Zinc Oxide (a-IGZO) TFT technologies and to calculate the onset temperature of negative differential resistance (NDR) in Germanium photodiodes.
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关键词
ESD,TLP,pulsed heating,Germanium,IGZO
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