Thermoreflectance Imaging of Back-Irradiance Heating in High Power Diode Lasers at Several Operating Wavelengths
IEEE Journal of Selected Topics in Quantum Electronics(2019)
摘要
In optical systems employing high-power diode lasers, back-irradiance of emission onto the laser facet has been found to contribute to catastrophic optical damage. In this paper, thermoreflectance imaging has been used to measure quantum well temperature rise at the facet for diode lasers emitting at several wavelengths under a wide range of back-irradiance beam positions. For TM-polarized diode l...
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关键词
Measurement by laser beam,Mirrors,Diode lasers,Semiconductor lasers,Semiconductor device measurement,Laser beams,Optical imaging
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