Scalable analytical model for reliability measures in aging VLSI by interacting Markovian agents
Performance Evaluation(2019)
摘要
Aging phenomena in VLSI are enhanced by the shrinkage in transistor dimension with consequent increase in operating temperature and current density, and are now recognized as a major cause in the reduction of the chip lifetime and reliability.
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关键词
Modeling,Reliability evaluation,VLSI aging,MCSoC,SSD
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