A 5gs/S 8-Bit Adc With Self-Calibration In 0.18 Mu M Sige Bicmos Technology
ELECTRONICS(2019)
摘要
A 5 GS/s 8-bit analog-to-digital converter (ADC) implemented in 0.18 m SiGe BiCMOS technology has been demonstrated. The proposed ADC is based on two-channel time-interleaved architecture, and each sub-ADC employs a two-stage cascaded folding and interpolating topology of radix-4. An open loop track-and-hold amplifier with enhanced linearity is designed to meet the dynamic performance requirement. The on-chip self-calibration technique is introduced to compensate the interleaving mismatches between two sub-ADCs. Measurement results show that the spurious free dynamic range (SFDR) stays above 44.8 dB with a peak of 53.52 dB, and the effective number of bits (ENOB) is greater than 5.8 bit with a maximum of 6.97 bit up to 2.5 GS/s. The ADC exhibits a differential nonlinearity (DNL) of -0.31/+0.23 LSB (least significant bit) and an integral nonlinearity (INL) of -0.68/+0.68 LSB, respectively. The chip occupies an area of 3.9 x 3.6 mm(2), consumes a total power of 2.8 W, and achieves a figure of merit (FoM) of 10 pJ/conversion step.
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关键词
folding and interpolating, time-interleaved, analog-to-digital converter, SiGe BiCMOS, self-calibration
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