Strongly Electronic-Correlated Material For Ultrafast Electronics Application

O. M. Ishchenko,F. Hamouda, P. Aubert, O. Tandia,M. Modreanu, D.I Sharovarov,F.Ya. Akbar,A. R. Kaul, G. Garry

2018 IEEE 18TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO)(2018)

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摘要
Strongly electronic-correlated material as VO2 has been investigated for ultrafast electronic applications due to their rapid and reversible Metal-Insulator transition. In this paper we report the design, simulation and fabrication of VO2-based RF-switches in two configurations (shunt and series). In order to achieve this goal thin layers of VO2 have been integrated with coplanar waveguides for the fabrication of microwave switches with thermally activated ON/OFF states. The MOCVD VO2 films were grown on sapphire substrates and have been characterized by XRD, AFM and Raman spectroscopy. The modeling and simulation results have been found to be in good agreement with the experimental RF measurements.
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关键词
ultrafast electronic applications,based RF-switches,reversible metal-insulator transition,MOCVD,strongly electronic-correlated material,thin films,sapphire substrate,XRD,AFM,Raman spectroscopy,VO2
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